X RAY POWDER DIFFRACTION FREE
Users also have free access to support and training with respect to their data analysis.įor more detailed information of our capabilities please read the relevant sections linked to the left.
X RAY POWDER DIFFRACTION SOFTWARE
To aid data analysis and interpretation the laboratory offers a wide range of software analysis tools including the latest ICCD structural databases and the Bruker Topas Rietveld analysis software. Non ambient experiments: -190☌ to 1600☌ under inert and reactive gas atmospheres, and 1-20bar gas pressure.Crystal structure determinination and Rietveld analysis.Crystallite size determination via Scherrer or whole pattern fitting methods.Routine sample analysis: Phase identification and purity.With these we can collect high quality data for a wide range of analysis objectives, including: Siemens D5005 equipped for high resolution powder data collection (The "A-Unit").Bruker D8 Focus with Lyn圎ye™ super-speed detector.Bruker D8 Advance with Våntec-1 super-speed detector.Bruker D8 Advance DaVinci, ("DaVinci2") with Lyn圎ye™ super-speed detector, Mo-source.Bruker D8 Advance DaVinci, ("DaVinci1") with Lyn圎ye™ super-speed detector and 60-position sample changer.We currently have four instruments with sample holders and ancillary equipment enabling the collection of data on a broad variety of specimens and under non-ambient environmental conditions. X-ray diffraction was discovered by Max von Laue in 1912. In this way we complement the educational role of the University, with on average ~60+ new users being trained every year. X-Rays are electromagnetic radiation with wavelengths in the range 0.1 - 100 Å (0.01-10nm) X Rays used in diffraction experiments have typical wavelengths of 0.5 - 1.8 Å X-rays were discovered by Wilhelm Roentgen who called them X-rays and it also called as Roentgen rays. The X-ray diffraction lab is primarily "user-operated", with routine data collection and analysis being performed by researchers themselves. Currently we boast state of the art diffraction facilities for the analysis of powders and solid compacts and we are open to users from all NTNU and SINTEF departments. The X-ray powder diffraction (XRPD) method provides an advantage over other means of.
In the case of X-ray diffraction, the medium which interacts with the photons of the X-rays is. The powder diffraction facility at the Institute for Materials Technology was established in its modern form in 1997, and has grown since then to service the needs of both IMT and the wider NV Faculty. An estimate of the amorphous and crystalline fractions(1) can also be made. with waves of a suitable wavelength (usually monochromatic). Modern laboratory scale instrumentation is both fast and easy to use, and is consequently ubiquitous in both research and industrial analysis laboratories. It is a very flexible method also, with applications ranging from quantitative assessment of industrial feed and product materials to complex crystal structure determination. X-ray diffraction is a central technique in the investigation of condensed matter, providing direct insight into the crystal structures of materials. X-ray powder diffraction method is one of the few non-destructive methods that permit the identification and the elemental analysis of materials.
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